The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2001

Filed:

Jul. 27, 1998
Applicant:
Inventors:

Gary B. Davis, Rowlett, TX (US);

John Fee, Richardson, TX (US);

Shoa-Kai Liu, Richardson, TX (US);

Assignee:

MCI Communications Corporation, Washington, DC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 1/008 ;
U.S. Cl.
CPC ...
H04B 1/008 ;
Abstract

A method of monitoring performance of an optical communications system measures (i) sub-carrier signal-to-noise ratio, (ii) optical signal signal-to-noise ratio, and (iii) measuring optical signal bit error rate, and diagnoses a system component failure based upon measured sub-carrier signal-to-noise ratio, optical signal signal-to-noise ratio, and optical signal bit error rate.


Find Patent Forward Citations

Davis, Gary. (2001). Method of and system for diagnosing optical system failures (U.S. Patent No. 6215565). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6215565

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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