The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2001
Filed:
Oct. 05, 1999
Herbert Von Wallfeld, Jülich, DE;
Thomas Neuhann, Müchen, DE;
Other;
Abstract
In this method, the refraction performance is either measured along the path of rays (,) for a multitude of ray paths which are distributed across a surface, each path originating from one point (P), or is given based on empirically established values. Afterwards the distances of the incident rays between the surfaces intersected by the path of rays are measured along the path or are given based on empirically established values, and the required shape of at least one surface intersected by the paths of rays is calculated based on those values so that the paths of rays intersect in one point as accurately as possible. Based on the values derived in this way optical fittings (,) can be calculated which can be placed on the cornea surface (,), inserted into the inner cornea, attached to the anterior section (,) of the eye and inserted into the inner part of the eye in order to simulate arithmetically all measures that change the refraction power of the eye before the measure is actually implemented. As an example a device for the manufacture of an artificial lens (,) is described.