The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2001

Filed:

Oct. 15, 1998
Applicant:
Inventors:

Hideaki Hara, Chiryu, JP;

Shoji Iriyama, Inazawa, JP;

Assignee:

Denso Corporation, Kariya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 3/08 ;
U.S. Cl.
CPC ...
G01M 3/08 ;
Abstract

A leakage inspection method and apparatus having a pressure wave generating means, including an air supply source, a regulator, and a solenoid valve. A pressure wave of a fluid is applied to a normal flow path of an measurement object by the pressure wave generating means to detect internal leakage by measuring, by means of a microphone, a difference between the transfer time during which the pressure wave passes through the normal flow path and the transfer time during which the pressure wave passes through the leakage flow path. Accordingly, the internal leakage of the fluid, flowing in the leakage flow path bypassing the normal flow path of an equipment having a partition and the normal flow path separated by the partition, is detected, if any.


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