The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2001
Filed:
Apr. 15, 1998
Gennady Feygin, Dallas, TX (US);
Robert B. Staszewski, Garland, TX (US);
Michel Combes, Dallas, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A method for generating an updated path metric includes combining each of first and second provisional path metric first portions with an associated branch metric first portion to produce a first provisional updated path metric first portion candidate and a second provisional updated path metric first portion candidate, respectively. The method also includes selecting one of the provisional first portion updated path metric candidates to produce an updated path metric first portion candidate and combining any carry component of the selected updated path metric first portion candidate with a path metric second portion and a branch metric second portion to produce a first updated path metric second portion candidate. The method also includes comparing the updated path metric second portion candidate to at least one other updated path metric second portion candidate; and selecting one of the updated path metric second portion candidates to produce an updated path metric second portion.