The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2001

Filed:

Oct. 22, 1998
Applicant:
Inventors:

David B. Johnson, Cortlandt Manor, NY (US);

Thomas Hampp-Bahamueller, Tuebingen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/720 ;
U.S. Cl.
CPC ...
G06F 1/720 ;
Abstract

A module information extraction system capable of extracting information from natural language documents. The system includes a plurality of interchangeable modules including a data preparation module for preparing a first set of raw data having class labels to be tested, the data preparation module being selected from a first type of the interchangeable modules. The system further includes a feature extraction module for extracting features from the raw data received from the data preparation module and storing the features in a vector format, the feature extraction module being selected from a second type of the interchangeable modules. A core classification module is also provided for applying a learning algorithm to the stored vector format and producing therefrom a resulting classifier, the core classification module being selected from a third type of the interchangeable modules. A testing module compares the resulting classifier to a set of preassigned classes, where the testing module is selected from a fourth type of the interchangeable modules, where the testing module tests a second set of raw data having class labels received by the data preparation module to determine the degree to which the class labels of the second set of raw data approximately corresponds to the resulting classifier.


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