The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2001
Filed:
May. 10, 1999
Applicant:
Inventors:
Xianhuai Zhu, Sugar Land, TX (US);
Suat Altan, Sugar Land, TX (US);
Matthew A. Brzostowski, Houston, TX (US);
Weizhug Wang, Katy, TX (US);
Assignee:
PGS Tensor, Inc., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/00 ; G01V 1/28 ; G06F 1/900 ;
U.S. Cl.
CPC ...
G01V 1/00 ; G01V 1/28 ; G06F 1/900 ;
Abstract
Method and systems are provided for processing c-wave data resulting in less sensitivity to errors in p-wave velocity analysis. Therefore, according to one aspect of the invention, a process is provided for processing c-wave data, the process comprising: providing zero-offset gather without a hyperbolic movement correction; performing migration on the zero-offset gather; performing velocity analysis on the migrated zero-offset gather; and performing NMO on the migrated data using the velocity from the velocity analysis.