The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2001
Filed:
Feb. 05, 1999
Kenji Kawasaki, Tokyo, JP;
Kazuo Kajitani, Tokyo, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A microscope illumination optical system for an ultra-low magnification wherein the roughness of a light diffusing plate is not visible, and uniform illumination can be performed, and wherein specimens of weak contrast, a phase distribution, etc. can be made visible through adjustment of the numerical aperture by varying the aperture of an aperture stop. A collector lens system forms a first image of a light source. A first variable stop is placed at the first image position. An intermediate lens system has a second variable stop therein and forms an image of the first variable stop behind the system. A plurality of condenser lens systems of different magnifications are interchangeably placed between the intermediate lens system and a specimen plane. A condenser lens system having the smallest magnification is arranged such that an image of the second variable stop is formed at a finite position in the space of the specimen plane, and a position conjugate to the specimen plane is located closer to the light source than the first variable stop.