The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2001

Filed:

Oct. 02, 1998
Applicant:
Inventors:

Joseph G. Weiland, Valencia, PA (US);

Henry M. Dimmick, Sr., late of Butler, PA (US);

Assignee:

AGR International, Inc., Butler, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

A method and apparatus are provided for inspecting glass containers for checks. The container finish is illuminated from the exterior and light reflected from a check is detected by the apparatus. In one embodiment, the glass container finish is inspected for horizontal and related diagonal checks and, in another, the glass container finish is inspected for vertical and related diagonal checks. The checks redirect the normal beam of light and thereby permit the reflected light to be delivered to a detector which converts the received light into a corresponding electrical signal which is compared to a standard in order to determine whether the container should be rejected. The method eliminates incorrect inspection results due to reflection of light caused by threads, lugs, mold seams, takeout beads and the sealing surface of the container mouth. The vertical and horizontal embodiments may be combined into a single system which inspects for vertical, horizontal and diagonal checks.


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