The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2001
Filed:
Sep. 30, 1998
Sunil Narayan Shabde, Cupertino, CA (US);
Yowjuang W. Liu, San Jose, CA (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
Apparatus and methods for determining the robustness and angle sensitivity of a device to soft errors generated by alpha-particle and/or cosmic ray strikes. In one embodiment, the method includes the steps of producing a light pulse with a given light pulse energy; applying the light pulse to the device at a predetermined location and a predetermined angle; varying the light pulse energy; and detecting soft errors in the device. In another embodiment, the apparatus includes a first fixture for supporting the device; a light source for producing a light pulse which is applied to the device at a predetermined location, the light pulse having a given light pulse energy and a given pulse energy; a second fixture for supporting the light source, wherein the first fixture and the second fixtures are movable relative to each other so that the light pulse is applied to the device at a predetermined angle; a light pulse energy varying circuit coupled to the light source and configured to vary the light pulse energy; and a detecting circuit coupled to the device and configured to detecting soft errors in the device.