The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2001

Filed:

Aug. 12, 1999
Applicant:
Inventors:

Wan-Yih Lien, Hsinchu, TW;

Meng-Jaw Cherng, Hsinchu Hsien, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/13056 ;
U.S. Cl.
CPC ...
H01L 2/13056 ;
Abstract

The invention describes a self-aligned etching process. A conductive layer and a first insulating layer are formed on a substrate in sequence, and then the conductive layer and the first insulating layer are patterned to form a plurality of stacks on desired regions. Subsequently, spacers are formed on sidewalls of each stack, and a stop layer is then formed on the substrate. A second insulating layer is formed on the substrate and is planarized. Portions of the second insulating layer are removed to form a plurality of openings and to expose portions of the stop layer located between spacers. The exposed stop layer is removed.


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