The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2001

Filed:

Oct. 04, 1999
Applicant:
Inventors:

Tomokazu Yasuda, Minami-ashigara, JP;

Kenichi Nakamura, Minami-ashigara, JP;

Taku Nakamura, Minami-ashigara, JP;

Kazuhiro Nakamura, Minami-ashigara, JP;

Assignee:

Fuji Photo Film Co., Ltd., Minami-Ashigara, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 7/004 ;
U.S. Cl.
CPC ...
G03F 7/004 ;
Abstract

An anti-reflection film comprises a high refractive index layer having a refractive index of 1.65-2.40, and a low refractive index layer having a refractive index of 1.20-1.55. Another anti-reflection film comprises only a low refractive index layer having a refractive index of 1.20-1.55. In the invention, the first improvement resides in a high refractive index layer composed of inorganic fine particles having a mean particle size of 1-200 nm in an amount of 5-65 vol. % and a crosslinked anionic polymer in an amount of 35 to 95 vol. %. The second improvement resides in a low refractive index layer composed of inorganic fine particles having a mean particle size of 0.5-200 nm in an amount of 50-95 wt. % and a polymer in an amount of 5-50 wt. %, and two or more of those particles are piled up to form micro voidsby the adjacent particles.


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