The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2001
Filed:
Jul. 01, 1998
Graham P. Eatwell, Annapolis, MD (US);
Adaptive Audio, Inc., Annapolis, MD (US);
Abstract
A method and apparatus are provided for simultaneously characterizing the disturbance of a dynamical system and the dynamic response model of the system. The disturbance is characterized by a sum of reference signals weighted by disturbance parameters. The dynamic response model is similarly characterized by a set of response parameters, which model the relationship between a set of test signals and the response to these test signals. The disturbance parameters and the response parameters are estimated jointly to provide a characterization of the dynamical system. This estimation is achieved by sensing the system at one or more locations to obtain a sensed signal, obtaining reference signals related to the disturbances, synthesizing an estimate of the sensed signal from the reference signals, the test signals, the disturbance parameters and the response parameters, and jointly adjusting the disturbance parameters and the response parameters according to the difference between the synthesized signal and the sensed signal. The characterization may be incorporated in systems or methods for control or monitoring of dynamical systems.