The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2001

Filed:

Jun. 18, 1998
Applicant:
Inventors:

Isao Koda, Aichi, JP;

Masakazu Tsukamoto, Aichi, JP;

Hideki Fujita, Aichi, JP;

Toshihiro Nakamura, Aichi, JP;

Shoji Nishimura, Kyoto, JP;

Yasuyuki Natsuda, Kyoto, JP;

Toshihiko Shikata, Kyoto, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/100 ;
U.S. Cl.
CPC ...
G01R 2/100 ;
Abstract

Frequencies fx between the measurement harmonic (mth-degree harmonic) and the (m±1)th-degree harmonics are determined from an expression of fx=(fs*m)±{(fs/n)*k)} where n and k are each an integer. Currents of inter-harmonics of the frequencies fx above and below the measurement harmonic are injected into an inject point in a power system in n cycles of the fundamental wave. Voltage at the inject point based on the injected currents and currents at least either upstream or downstream from the inject point are measured. Admittances for the inter-harmonics above and below the measurement harmonic on at least either the upstream or downstream side from the harmonic inject point are calculated from the measurement results. Interpolation processing based on the calculation results is performed, thereby finding and determining an admittance for the measurement harmonic.


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