The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2001
Filed:
Aug. 12, 1999
Evotec Biosystems AG, Hamburg, DE;
Abstract
A method for differentiating or detecting particles in a sample in which several classes of particles may be present by identifying signal segments of time-resolved, optical raw signals from the sample on the basis of single photon detection (single pulse detection), wherein the sample contains at least two classes of particles; the sample is illuminated by a light source; the optical raw signals emitted by the sample, which are derived from at least one measuring volume element V, V≦10,l, are detected with at least one detector unit; at least one particle generates a signal fraction during its residence in the measuring in the measuring volume element; a signal segment of the optical raw signals is determined by the particle's actively and/or passively entering and then leaving again the measuring volume element; the optical raw signals are segmented into arbitrary segments; at least one set of statistical data based on the optical raw signals is established for at least one arbitrarily chosen segment; and the at least one set of statistical data or at least one combination of several sets of statistical data is evaluated for the presence of features characteristic of the signal fraction from at least one class of particles.