The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2001

Filed:

Jul. 20, 1999
Applicant:
Inventor:

Seiichiro Nagai, Otawara, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/44 ;
U.S. Cl.
CPC ...
H05G 1/44 ;
Abstract

An X-ray diagnostic apparatus forms image data using an arbitrary region in the detectable area of a planar detector having a plurality of X-ray detector elements arrayed in a matrix. An X-ray sensor array for exposure-controlling having a plurality of X-ray sensors arrayed in a matrix overlaps the planar detector. An X-ray controller controls an X-ray tube unit on the basis of an output from the X-ray sensor array in order to optimize the X-ray dose on a subject. A controller selects at least one X-ray sensor in accordance with the position of a partial region where an image is formed. The controller controls at least one of the X-ray sensor array and X-ray controller so as to control the X-ray dose on the basis of an output from the selected X-ray sensor.


Find Patent Forward Citations

Loading…