The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2001
Filed:
Jul. 10, 1997
Federico D. Martin, Missouri City, TX (US);
PGS Tensor, Inc., Houston, TX (US);
Abstract
Methods are provided for automatic detection of linear seismic events and the detected events are used in correction of statics and geometry error. According to an example embodiment, a method is provided for automatically detecting substantially linear seismic events in multiple element data, and for correcting geometry and statics errors, wherein at least one element of the data comprises a shot and at least one other element of the data comprises a receiver, for a common element gather of traces, the method comprising: band pass filtering the traces; computing the complex trace envelope of traces of the gather; filtering out a DC component of the traces; sorting the gather by a first element line, a first element, a second element line, a second element, and an offset bin, wherein a sorted gather of traces is defined; wherein said computing and said sorting define a sorted gather of complex trace envelopes; transforming the sorted gather of complex trace envelopes into a set of velocity stack trace envelopes; wherein said traces are divergence corrected before said transforming and wherein said traces are positive bulk time shifted before said transforming; picking events from the velocity stack trace envelopes; determining statics error based on said picking; correcting said statics error; determining geometry error based on said picking; and correcting said geometry error.