The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2001

Filed:

Sep. 08, 1999
Applicant:
Inventors:

Seng-Ieong Wong, Plano, TX (US);

Jian-Yu Liu, Garland, TX (US);

Kuang-Yi Wu, Plano, TX (US);

Assignee:

Chorum Technologies Inc., Richardson, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 1/402 ; H04J 1/406 ;
U.S. Cl.
CPC ...
H04J 1/402 ; H04J 1/406 ;
Abstract

A wavelength division demultiplexing device is presented utilizing a polarization-based filter or a multi-cavity etalon (e.g., a multi-cavity Fabry-Perot etalon) to obtain a flat-top filter response which can be utilized to create a flat-top slicer which separates out odd and even wavelengths, or upper and lower channels of an input WDM signal. The flat-top slicer can be used as the first stage of a cascaded network of wavelength demultiplexers in which following stages can be based on polarization-based filters, multi-cavity etalons, or other interferometric WDM devices, which are adequate due to the increased channel spacing obtained in the first stage of the network.


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