The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2001
Filed:
Feb. 09, 2000
Satoru Satake, Tokyo, JP;
Yukio Hosaka, Hiroshima, JP;
Hideharu Maruyama, Hiroshima, JP;
Nobuhiko Nakamura, Hiroshima, JP;
Nobuharu Yagishita, Hiroshima, JP;
Satake Corporation, Tokyo, JP;
Abstract
A method and an apparatus are provided for estimating a quality of grains to be harvested from a grain plant in the future, during a growth period prior to the harvesting. The method comprises the step for establishing a quality conversion coefficient for estimating a specific quality of grains after the harvesting based on absorbencies relating to the specific quality of the grains obtained by irradiating light having predetermined wavelength regions on a leaf of a grain plant in growth at a predetermined time during the growth period of the grain plant and the specific quality obtained from the same grains after the harvesting, and the step for estimating the quality of the grains to be harvested in the future based on said quality conversion coefficient and absorbencies relating to said specific quality obtained from a leaf of the grain plant presently growing at the predetermined time. The measurement for estimating the quality of the grains can be carried out in an easy and simple manner during the growth of grain plants.