The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2001
Filed:
Jun. 14, 1999
Applicant:
Inventor:
Theodore B. Ladewski, Ann Arbor, MI (US);
Assignee:
Visteon Global Technologies, Inc., Dearborn, MI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/188 ;
U.S. Cl.
CPC ...
G01N 2/188 ;
Abstract
A method of determining optical quality of a transparent product includes passing a first gray-scale pattern through the material; obtaining a first image of the first pattern with an image pickup device after the first pattern has passed through the material; and determining optical quality of the material based on data obtained from the first image. An apparatus for determining optical quality of such a material is also disclosed.