The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2001
Filed:
Jun. 28, 1999
Applicant:
Inventors:
Minoru Murata, Tokyo, JP;
Masanori Miyawaki, Kanagawa, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 1/390 ;
U.S. Cl.
CPC ...
G01S 1/390 ;
Abstract
A synthetic aperture radar system fluctuation compensating apparatus includes a synthetic aperture radar mounted on a flying unit, a data acquiring unit, a position measuring unit and a position determining unit. The data acquiring unit receives a reception data by the synthetic aperture radar. The position measuring unit measures a position of the flying unit to generate a position data. The position determining unit determines a correct position of the flying unit based on the reception data and the position data to generate a compensated position data.