The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2001

Filed:

Apr. 01, 1999
Applicant:
Inventors:

Wolfgang Schwobel, Mannheim, DE;

Bernd Hein, Dossenheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 3/100 ; G01N 3/348 ;
U.S. Cl.
CPC ...
B32B 3/100 ; G01N 3/348 ;
Abstract

A process for the production of analytical devices is provided in accordance with the present invention. Analytical devices include analytical test elements with a capillary-active zone for examining liquid samples. In the process a carrier layer is prepared, a spacer layer is laminated onto the carrier layer, a contour is punched, cut or stamped through the spacer layer laminated onto the carrier layer which determines the shape of the capillary-active zone, those parts of the spacer layer which are not required to form the capillary-active zone are removed from the carrier layer and a cover layer is applied to the spacer layer to result in a capillary-active zone. The process according to the invention is preferably suitable for manufacturing analytical devices from tape material.


Find Patent Forward Citations

Schwobel, Wolfgang. (2001). Process for the production of analytical devices (U.S. Patent No. 6207000). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6207000

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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