The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2001

Filed:

May. 01, 1998
Applicant:
Inventors:

James C. Hahn, Delran, NJ (US);

David P. Bubnoski, Marlton, NJ (US);

Anatoly Kotlarsky, Holland, PA (US);

Assignee:

Auto Image ID, Inc., Cherry Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/900 ;
U.S. Cl.
CPC ...
G06F 1/900 ;
Abstract

A method and apparatus for aligning a target within a field of view of an optical scanner is provided. In an optical scanner having a field of view, apparatus for indicating whether a target is aligned within said field of view includes a microprocessor and an alignment indicator. The alignment indicator is electrically connected to the microprocessor and includes, for example, a light emitting diode. The microprocessor defines a first zone and a second zone within the field of view and determines whether the target is within the field of view. If the target is within the field of view, the microprocessor identifies a target alignment point on the target. The microprocessor determines whether the target alignment point is within either the first zone or the second zone and sends a signal to the alignment indicator. In response, the alignment indicator provides an indication indicating whether the target alignment point is located within the first zone, the second zone, or neither.


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