The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2001

Filed:

Dec. 08, 1998
Applicant:
Inventors:

Thomas Breuer, Constance, DE;

Wilfried Hanisch, Radolfzell, DE;

Jürgen Franke, Ulm, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 ; G06K 9/68 ;
U.S. Cl.
CPC ...
G06K 9/62 ; G06K 9/68 ;
Abstract

A method and an arrangement are presented for pattern recognition on the basis of statistics. According to the method, for an object to be recognized on the basis of a complete set of two-class or multiclass classifiers, the association with each target class of the class set is estimated with a numerical value that is produced by cascaded use of polynomial classifiers. According to the invention, on a learning sample in which all class patterns to be recognized are sufficiently represented, there is a selection, from all the two-class or multiclass classifiers by way of their estimation vector spectrum, of those two-class or multiclass classifiers with estimations contributing the most to minimize a scalar quantity calculated over the estimation vector spectrum and having high separating relevance. The selected two-class or multiclass classifiers are subsequently used to form, via an expanded learning sample, estimation vectors from which expanded characteristic vectors are produced by polynomial linking. An evaluation classifier is formed on the basis of said characteristic vectors for estimating all target classes.


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