The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2001
Filed:
Apr. 25, 2000
Lee Chase, Los Gatos, CA (US);
Honeywell International Inc, Morristown, NJ (US);
Abstract
A measurement apparatus for sensing three properties of materials including a fixed impedance element coupled in series with the sensor array between an input signal and a reference potential (e.g. ground). The sensor array exhibits a variable impedance resulting from changes in physical characteristics of the material. The variable impedance of the sensor array relates to changes in property of the material being sensed which can then be related to changes in other physical characteristics of the material such as weight, chemical composition, and temperature. The reduced size and increased resolution of the sensor array is particularly adaptive to a twin mesh sheetmaking system.