The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2001

Filed:

May. 01, 2000
Applicant:
Inventors:

Ryosuke Taniguchi, Tokyo, JP;

Shinichi Hattori, Tokyo, JP;

Takahiro Sakamoto, Tokyo, JP;

Takashi Shimada, Tokyo, JP;

Kanji Matsuhashi, Hiroshima-ken, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/900 ;
U.S. Cl.
CPC ...
G01N 2/900 ;
Abstract

A nondestructive testing apparatus is provided with a wave transmitter by a metal-based magnetostrictive vibrator, a magnetically excited current feeding device for feeding the magnetically excited current to the magnetostrictive vibrator, a wave receiver for detecting an acoustic elastic wave propagating through the measurement object, a filter for extracting a signal in a target frequency band to be measured, and an automatically amplifying rate controlling function-equipped amplifier for automatically controlling the amplifying rate so as to obtain a given magnitude amplitude regardless of the magnitude of the reflection wave or the transmission wave detected by the wave receiver, which constitute a feedback loop. The apparatus is further provided with a signal processor for processing the signal detected by the above-described wave receiver, and a display device for displaying the process result obtained by the signal waveform detected by the above-described wave receiver or the above-described signal processor.


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