The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2001

Filed:

Apr. 30, 1999
Applicant:
Inventors:

Lionel Beffy, Courcouronnes, FR;

Mathias Alexandre Fink, Meudon, FR;

Yves Gérard Mangenet, Epinay Sous Senart, FR;

Véronique Miette, Paris, FR;

Jean François Wu, Orsay, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/904 ; G01N 2/910 ;
U.S. Cl.
CPC ...
G01N 2/904 ; G01N 2/910 ;
Abstract

An ultrasonic testing method for parts of complex geometry comprises using a multielement transducer transmitting focused ultrasonic waves into the part to be tested. The focusing of the ultrasonic waves is implemented in two different modes using multichannel control electronics. The two focusing modes are an electronic focusing mode and a time reversal focusing mode which are selected as a function of the depth of the particular test zone. The time reversal focusing mode is selected to test central zones located at the largest depths around the longitudinal axis of the part. The electronic focusing mode is selected to test intermediate zones situated at depths between the central zones and a peripheral zone of the part.


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