The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2001
Filed:
Feb. 04, 1999
Hitoshi Hirai, Miyanohigashi-machi, JP;
Masahiko Sannomiya, Miyanohigashi-machi, JP;
Horrba, Ltd., Kyoto, JP;
Abstract
A forming method for a calibration curve in an infrared gas analyzer. The forming method minimizes the systematic error that occurs in the infrared gas analyzer improves measuring precision. The forming method modifies a method in which gases having different concentrations are supplied to an infrared gas analyzer. The gas analyzer has the outputs corresponding to the gas concentrations, and samples the gas concentrations as a plurality of points, the number of which is not less than four. A calibration curve is approximated by up to a fourth-order polynomial using a method of least squares based upon the measured values of not less than 4 points thus sampled. In carrying out the above-mentioned polynomial approximation, an inverse number of the square of the divided ratio at each point of the calibration curve is used so as to carry out a weighting operation.