The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2001
Filed:
May. 25, 1999
Peter P. Van Bemmel, Houston, TX (US);
Randolph E. F. Pepper, Sugar Land, TX (US);
Schlumberger Technology Corporation, Houston, TX (US);
Abstract
A method and apparatus are disclosed for testing a large plurality of displayed data points of recorded spatial data to determine and display trends created by different sets of the data points within the recorded spatial data. An analysis operator interactively uses an onscreen graphic tool called a widget to set trend search parameters after studying the displayed data points, and uses a pop-up menu to set other search and display parameters for the trend search. The onscreen graphic tool permits the user to easily see on-screen, and manually set, search parameters indicating the direction of a search from a user selected starting point, how far each step of a search will be performed for adjacent data points in a fault line, within what angle the search will be performed on either side of the user indicated search direction, and if trend searches being performed are in one or both directions from the user selected starting point in the recorded spatial data.