The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2001

Filed:

Sep. 20, 1999
Applicant:
Inventors:

Anh Bui, Sugar Land, TX (US);

Scott E. Smith, Sugar Land, TX (US);

Duy-Loan T. Le, Sugar Land, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/00 ;
U.S. Cl.
CPC ...
G11C 7/00 ;
Abstract

A circuit is designed with a detector circuit (,) coupled between a supply voltage terminal (,) and a reference voltage terminal (,). The detector circuit produces a first control signal in response to a detected mode and produces a second control signal in response to another mode. A first circuit (,) including a delay circuit receives the first control signal and a third control signal. The delay circuit produces a fourth control signal at an output terminal (,) in response to the first and third control signals. A second circuit (,) receives the second control signal and the third control signal. The second circuit produces the fourth control signal at the output terminal in response to the second and third control signals.


Find Patent Forward Citations

Bui, Anh. (2001). Timing circuit for high voltage testing (U.S. Patent No. 6201752). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6201752

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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