The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2001
Filed:
Mar. 20, 1998
James W. Overbeck, Hingham, MA (US);
Other;
Abstract
Wide angle, limited rotation, on-axis scanning with a micro objective lens, which is preferably aspheric, and is mounted on a rigid rotary structure that oscillates about a limited arc while a translation system translates the object under the arcuate scan. The micro objective lens communicates optically with a stationary optical system via a light path which, in part, extends along the axis of rotation of the rigid rotary structure. The rotary micro objective lens is shown to cooperate with stationary optics. Predetermined defocusing of some wavelengths relative to others in opposite sense to chromatic aberration of a micro objective lens enable focus by the micro objective lens of multiple wavelengths on the same point. Data collection in a rotary, on-axis scanner is controlled by detecting the actual position of the rotating structure, which may move at constant speed during data collection. Interpolation of arcuate scan data to a raster pattern is achieved by data sampling at positions that correspond with rectilinear rows of the raster pattern and averaging the sampled data points of a row that straddle a raster point. This results in fast, economical interpolation. Novel microscope processes use features provided by the instruments described.