The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2001
Filed:
Oct. 28, 1999
Applicant:
Inventors:
David E. Harris, Powell, OH (US);
Edwin B. Wagstaff, Jr., Delaware, OH (US);
Kevin C. Abnett, Fairbanks, AK (US);
Assignee:
Harris Instrument Corporation, Delaware, OH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/104 ;
U.S. Cl.
CPC ...
G01B 1/104 ;
Abstract
A system and process are described in which moving articles that are cut during a manufacturing process have their cut length measured with the use of an electronic light emitting scanner in combination with a light receiver. Accurate cut length measurements are obtained from mathematical processing of the light receiving information electronically gathered from the apparatus of the system.