The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2001
Filed:
Jul. 02, 1998
Shiro Ryu, Tokyo, JP;
Yukio Horiuchi, Tokyo, JP;
Kokusai Denshin Denwa Kabushiki Kaisha, Tokyo, JP;
Abstract
An apparatus for monitoring and measuring condition of a plurality of optical transmission lines individually according to this invention comprises at least one reflecting means having a predetermined reflection bandwidth arranged on each of said optical transmission lines; an optical pulse tester for outputting probe pulse light having predetermined wavelength in the reflection bandwidth of said reflecting means, and analyzing the reflected light of said probe pulse light in a time domain; optical coupling means for adding said probe pulse light from said optical pulse tester and a signal light, and coupling it to each of optical transmission lines through optical dividing means, along with coupling the reflected light of said probe pulse light to said optical pulse tester; and a plurality of optical filters arranged on the input end of each of said optical transmission lines for transmitting wavelength of signal light to be transmitted on their respective optical transmission lines and the predetermined wavelengths to be reflected on the reflection means on corresponding optical transmission lines. The predetermined wavelengths of a plurality of optical filters are different from each other.