The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2001
Filed:
Jun. 09, 1998
Yoshiaki Kuroda, Ishikawa-ken, JP;
Other;
Abstract
A turn broach abnormality sensing apparatus is provided for use in a turn broach for cutting a rotating workpiece (,) by rotating a broach cutter (,) that comprises a plurality of unitary cutters (,) axially coupled together, each having a plurality of tip rows (,) arranged on, a peripheral surface thereof in the form of a helicoid. The abnormality sensing apparatus includes a plurality of image pickup means (,) disposed corresponding respectively to the unitary cutters (,) of the broach cutter (,) for sensing an image of each of individual tips on the respective tip row of each of the plural unitary cutters, a focusing adjustment means (,) for maintaining a distance between the image pickup means (,) and each individual tip on the respective tip row of each of the unitary cutters, substantially constant, and an abnormality sensing means for image processing the image picked up by the image pickup means (,) of each individual tip to determine an extent of wear thereof or damage thereto, thereby ascertaining an abnormality of each of the individual tips.