The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 2001

Filed:

Jan. 22, 1998
Applicant:
Inventors:

Jiann-Chang Lo, San Jose, CA (US);

James Christopher Mahlbacher, Lake Worth, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/900 ;
U.S. Cl.
CPC ...
G01R 1/900 ;
Abstract

A method for determining whether short circuits exist among networks within a circuit under test includes bringing test probes into contact with each such network and switching groups of the test probes among two sides of a test circuit so that current flows through the testing circuit only when one of the test probes connected to one side of the testing circuit is connected by means of a short circuit to one of the test probes connected to the other side of the test circuit. This first test process establishes the fact that a short circuit exists without determining which networks are connected by the short circuit. A version of this method subsequently applies tests to individual networks to make this determination, in the event that a short circuit is found to exist by the first test process. Other versions of this method additionally determine which networks are connected to which other networks by short circuits.


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