The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2001
Filed:
Jun. 22, 2000
Manfred Eigen, Hamburg, DE;
Thorsten Winkler, Hamburg, DE;
Jens Stephan, Hamburg, DE;
Petra Schwille, Hamburg, DE;
Andre Koltermann, Hamburg, DE;
Ulrich Kettling, Hamburg, DE;
Klaus Dörre, Hamburg, DE;
Jan Bieschke, Hamburg, DE;
Evotec BioSystems AG, Hamburg, DE;
Abstract
The invention relates to a method for detecting reactions and conformational changes of analytes in a sample by coincidence analysis, as follows: the sample is marked with at least two different fluorescent dyes and then illuminated with at least one laser in order to stimulate the emission of fluorescence; the fluorescence signals are detected by at least two detection units and each signal is broken down into any simultaneous time segments with the desired time slot widths; the number of signals contained in at least one time segment and/or the time intervals between signals in the time segments are detected; a coincidence analysis of the data detected is carried out for at least one time segment of the first detection unit with at least one isochronous time segment of the second detection unit; statistics are produced showing the results of the coincidence analysis and/or the results are subjected to a threshold value analysis, and these statistics or a combination of more statistics are evaluated for the presence of characteristic features.