The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2001
Filed:
Mar. 12, 1999
Robert H Nath, Albuquerque, NM (US);
James J Schwarz, Albuquerque, NM (US);
Jay G Saxon, Corrales, NM (US);
Quasar International, Inc., Albuquerque, NM (US);
Abstract
Modal frequencies of known good sample parts (SN) are analyzed to determine a pattern which will identify acceptable material and dimensional variations. The data obtained by analysis is then archived. Production parts are then measured at the modal frequencies and the production parts are accepted or rejected after pattern analysis of each part by comparing the production part with response to the pattern identified as acceptable for material and dimensional variations. Production part data is archived for future testing. This procedure is repeated throughout the lifetime of a part, and may be used on parts which are part of an assembly, including other unmeasured parts.