The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2001
Filed:
Dec. 03, 1998
William P. Kroll, Medina, MN (US);
Randie Evenson, Brooklyn Center, MN (US);
Intercomp Company, Minneapolis, MN (US);
Abstract
A leaf spring test apparatus, generally comprising a frame constructed and arranged to support a first end and a second end of a leaf spring, a force applicator disposed on the frame for applying a force to a predetermined area of the leaf spring, a force measurement gauge connected to the force applicator to gauge the amount of force applied to the leaf spring by the force applicator, and a distance measurement gauge connected to the leaf spring to gauge movement of the leaf spring upon the application of force by the force applicator to the leaf spring. A method for testing and measuring the spring rate of leaf springs, comprising the steps of installing a leaf spring on a leaf spring test apparatus, zeroing a leaf spring test apparatus, pumping a jack on the leaf spring test apparatus to raise the leaf spring a desired distance, and reading a force measurement gauge.