The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 13, 2001
Filed:
Apr. 06, 1998
Johannes I. Boerhout, La Mesa, CA (US);
Phillip L. Maness, El Cajon, CA (US);
Hoa Nguyen, San Diego, CA (US);
Wane D. Wier, San Diego, CA (US);
SKF Condition Monitoring, Inc., San Diego, CA (US);
Abstract
A method and system for monitoring the operational condition of a machine is disclosed. The system includes: a test probe configured to be coupled to the machine for measuring an operational parameter of the machine and for outputting a test signal representative of the measured operational parameter; a fault condition detection circuit, coupled to the test probe, for receiving and processing the test signal so as to detect a fault condition of the machine; a probe failure detection circuit, coupled to the test probe, for receiving the test signal and detecting a failure condition of the test probe if the test signal is not within defined limits, wherein the probe failure detection circuit provides a data path that is separate from the fault condition detection circuit; and a processor, coupled to the fault condition detection circuit and the probe failure detection circuit, for initiating a defined action in response to signals received from the fault condition detection circuit and the probe failure detection circuit. The method includes the following acts: measuring an operational parameter of the machine with a probe coupled to the machine; outputting a test signal representative of the measured operational parameter; providing the test signal to a machine fault detection circuit for processing; determining whether the test signal indicates that a machine fault condition exists; providing the test signal to a probe failure detection circuit; determining whether the test signal indicates a probe failure condition exists, wherein the probe failure detection circuit operates independently of the machine fault detection circuit; and initiating a defined action if it is determined that a machine fault condition exists and a probe failure condition is not detected.