The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2001
Filed:
Sep. 26, 1997
Applicant:
Inventor:
Teruyoshi Washizawa, Atsugi, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 ; G06K 9/62 ;
U.S. Cl.
CPC ...
G06K 9/00 ; G06K 9/62 ;
Abstract
In a pattern recognition apparatus, light from an original on which a pattern to be recognized is depicted is focused by an optical system. The focused image is sampled by a two-dimensional array sensor. The pattern depicted on the original is recognized based on a multiresolution partial image obtained by the sampling. A moving device moves the optical axis of the optical system relative to the original in response to a control signal based on the result of the recognition.
Washizawa, Teruyoshi. (2001). Apparatus and method for recognizing a nonuniformly sampled pattern (U.S. Patent No. 6198847). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6198847
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile