The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2001
Filed:
Sep. 05, 1997
Chih-Chau L. Kuan, Redmond, WA (US);
Shih-Jong J. Lee, Bellevue, WA (US);
Seho Oh, Mukilteo, WA (US);
Wendy R. Bannister, Seattle, WA (US);
Michael G. Meyer, Seattle, WA (US);
Tripath Imaging, Inc., Burlington, NC (US);
Abstract
Dynamic control of the processing flow of an image analyzer such as a biological specimen analyzer as processing proceeds. Data collected and processed from a specimen under analysis, such as a biological specimen on a microscope slide, determines the fate of further processing. If there is enough evidence, based on the data collected from a slide, to make a decision with sufficient confidence, the processing of the slide can be stopped and a decision may be rendered. By avoiding unnecessary additional computation system throughput may be enhanced. Otherwise, data collection and computation continues until either certain termination criteria are met or no more data is left to acquire. This slide-dependent control and decision making method flexibly limits the amount of computation required to reach a system decision about a specimen. By evaluating analysis processing continuously a maximum signal to noise ratio may be achieved by preventing additional noise from entering the analysis and thus swamping signal information.