The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2001
Filed:
Feb. 18, 1999
Bartholomeus G. M. H. Dillen, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
An X-ray examination apparatus comprises an X-ray detector,for deriving an image signal and a measurement signal from an X-ray image. The X-ray examination apparatus also includes an exposure control,for adjusting the X-ray examination apparatus on the basis of the measurement signal. The X-ray detector is arranged in such a manner that the measurement signal relates mainly to relevant image information in the X-ray image. The X-ray detector is notably provided with a conversion unit,for deriving an optical image from the X-ray image. An image sensor with an image pick-up section derives electrical charges from the optical image. The image pick-up section notably derives a measurement component from the electrical charges wherefrom the measurement signal is derived and the image pick-up section also derives an image component from the electrical charges wherefrom the image signal is derived.