The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2001

Filed:

Sep. 24, 1999
Applicant:
Inventors:

Mamoru Ueda, Chofu, JP;

Taisuke Hirono, Chofu, JP;

Kohji Ohbayashi, Chofu, JP;

Itaru Yoshizawa, Chofu, JP;

Assignee:

Kowa Company, Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

An optical measuring instrument which enables measurement of necessary data in a short period of time and uses a light with a short coherence length. In this instrument, such a light emitted from a light source is divided into a measurement light and a plurality of reference lights. The plurality of reference lights are processed by different frequency modulations, and then multiplexed with a light reflected from a measurement object irradiated by the measurement light. On the basis of an output of a photoelectric converter for detecting the level of the multiplexed light and the frequency of each reference light, optical characteristic data related to a plurality of measurement points are calculated.


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