The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2001

Filed:

Mar. 29, 1999
Applicant:
Inventors:

Douglas O. Reudink, Kirkland, WA (US);

Mark D. Reudink, Seattle, WA (US);

Thomas W. Hammond, Peoria, IL (US);

Scot D. Gordon, Seattle, WA (US);

Sheldon K. Meredith, Duvall, WA (US);

Curtis F. McClive, Redmond, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 3/22 ; H04Q 7/20 ; H04B 7/216 ;
U.S. Cl.
CPC ...
H01Q 3/22 ; H04Q 7/20 ; H04B 7/216 ;
Abstract

A system and method are disclosed for improving trunking efficiency of a sectored cell by providing overlapping sectors. The disclosed invention teaches the use of multiple narrow beams composited to form a radiation pattern. Signals associated with each such narrow beam may be provided to inputs of a base station signal quality measuring device for assigning a mobile to a particular sector during call origination which inputs are associated with a particular sector of the radiation pattern. The number of narrow beam signals provided inputs associated with a particular sector defines the azimuthal width of that sector. By providing a same antenna beam signal to multiple sector inputs, overlapping sectors are defined.


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