The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2001

Filed:

Jun. 09, 1999
Applicant:
Inventors:

Takumi Fujikawa, Sanda, JP;

Motoji Kondo, Ashiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/298 ;
U.S. Cl.
CPC ...
G01S 7/298 ;
Abstract

The present invention provides a radar apparatus and like systems and method which comprise coordinate converting means for signals defined in a polar coordinate system to corresponding signals defined in Cartesian coordinate system, an image memory, and an indicator with pixels the number of which being the same as that of memory elements of the image memory, and further comprise means for drawing imaginary first and second sweep lines on pixels or memory elements of the image memory to determine a first sample point for a pixel on the second sweep line or to determine a last sample point for a pixel on the first sweep line, and perform a signal processing such as data correlation or interpolation in response to the detected last sample point or the first sample point detected so that displayed image quality is improved.


Find Patent Forward Citations

Fujikawa, Takumi. (2001). Radar and like systems and method for improving image quality (U.S. Patent No. 6198429). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6198429

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…