The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2001
Filed:
Apr. 27, 1998
Gary Lee Hensley, Milwaukee, WI (US);
David Justin Watson, Richland, WA (US);
Larry Stephen Price, Richland, WA (US);
Siemens Westinghouse Power Corporation, Orlando, FL (US);
Abstract
Flexible eddy current probes that allow an inspector to interrogate the blade roots or disk slots of different types of blades and disks while using a limited number of probes. The probe includes a rectangular-shaped block assembly, a rectangular-shaped loading platform having a slot therein, and stabilizing slide rods that couple the loading platform to the block assembly. The slide rods are adapted to slide through the block assembly as the block assembly is urged towards the loading platform. The probe further includes a flexible coil within a flexible membrane that produces a magnetic field during the inspection. The flexible coil extends from the block assembly and remains within the device, that is, between the loading platform and the block assembly, when not deployed. When deployed, the flexible coil passes through the slot in the loading platform to allow contact with the surface being inspected. Outriggers within the probe guide the flexible coil onto the surface during deployment.