The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2001

Filed:

Apr. 15, 1998
Applicant:
Inventors:

Agostino Abbate, Clifton Park, NY (US);

Julius Frankel, Rensselaer, NY (US);

Pankaj K. Das, Latham, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/3227 ;
U.S. Cl.
CPC ...
G01N 2/3227 ;
Abstract

An apparatus and/or system is described which uses the photocharge voltage concept in lieu of optical scattering techniques to measure surface topology and properties of materials. The system is based on the measurement of a small electrical potential difference which appears on any solid body when subjected to illumination by a modulated laser light. This voltage is proportional to the induced change in the surface electrical charge and is capacitively measured on various materials. The characterization of coatings to be used inside the base of guns is just one possible application for use by the U. S. Army.


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