The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 2001

Filed:

Nov. 09, 1998
Applicant:
Inventors:

Charles Jeffrey Conner, Dayton, OH (US);

James Richard Schlough, Troy, OH (US);

Alan Scott Farr, Huber Heights, OH (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B65H 4/308 ;
U.S. Cl.
CPC ...
B65H 4/308 ;
Abstract

An apparatus for measuring the thickness of flat products such as sheets or signatures, the flat products being fed from a pile of signatures to a pocket by a pocket feeder. The pocket feeder includes a first and second roller. The first roller is arranged against the second roller to form a nip therebetween for receiving a flat product. The first roller is deflectable when a flat product enters the nip. The apparatus comprises a first proximity target which is arranged on the first roller and a second proximity target which is fixedly arranged on the receiving unit. A proximity switch monitors the targets and a control unit starts and stops counting the pulses generated by an encoder. To calculate the thickness of a flat product, the counted pulses are compared to a stored value.


Find Patent Forward Citations

Conner, Charles. (2001). Thickness measurement apparatus (U.S. Patent No. 6196537). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6196537

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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