The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2001
Filed:
May. 02, 1997
Bruce F. Mielke, Los Altos Hills, CA (US);
Matthew C. Hendricks, Palo Alto, CA (US);
Howard Marshall, Portola Valley, CA (US);
Richard Swan, Portola Valley, CA (US);
Lee R. Althouse, Santa Clara, CA (US);
Ken A. Ito, San Jose, CA (US);
Altera Corporaiton, San Jose, CA (US);
Abstract
An electronic circuit tester (e.g., for testing integrated circuit wafers or packaged integrated circuits) is provided. The tester is preferably based on a relatively inexpensive computer system such as a personal computer and includes at least one high-precision clock circuit that is programmable with respect to frequency and number of clock pulses. The high-precision clock circuit is connectable to the circuit being tested to permit certain timing-critical tests to be performed, even though a large number of other data channels in the tester are controlled by a relatively low speed clock circuit. The tester also includes analog circuitry that can be programmed to provide various analog signals suitable for performing parametric testing on an electronic device under test.