The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2001
Filed:
Apr. 30, 1999
Koji Kobayashi, Tokyo, JP;
Hiroshi Nakajima, Tokyo, JP;
Takafumi Aoki, Miyagi, JP;
Masayuki Kawamata, Miyagi, JP;
Tatsuo Higuchi, Miyagi, JP;
Yamatake Corporation, Tokyo, JP;
Abstract
Collation Fourier image data (FIG.,D) FB generated by performing the two-dimensional discrete Fourier transform (DFT) for the image data (FIG.,C) of a collation pattern is synthesized with registration Fourier image data (FIG.,B) generated by performing the two-dimensional DFT for the image data of a registration pattern. After amplitude suppression processing is performed for the resultant data, two-dimensional DFT is performed. A correlation peak is extracted from a correlation component area which appears in the synthesized Fourier image data (FIG.,E) for which the two-dimensional DFT has been performed. A predetermined area including this correlation peak is then masked (FIG.,F). The two-dimensional DFT is performed for the masked synthesized Fourier image data, and amplitude restoration processing is performed for the data. The resultant data is re-synthesized with the registration Fourier image data FA, and the two-dimensional IDFT is performed for the synthesized data. With this processing, image data containing a difference pattern like the one shown in FIG.,G or a moving pattern can be obtained.