The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2001

Filed:

May. 13, 1999
Applicant:
Inventors:

Russell L. Kerschmann, Mill Valley, CA (US);

Andrew Hendrickson, San Francisco, CA (US);

Benn P. Herrera, San Francisco, CA (US);

Assignee:

Advanced Pathology Ststems, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

In general, the invention consists of a means for staining a sample with a fluorescent dye, a means for producing a darkfield image of the fluorescent stained sample, and a means of transforming an image of a sample stained with one or more darkfield dyes into an image stained with one or more brightfield dyes for examination on a computer monitor. The process includes applying a digital lookup table or other computational means in order to convert the darkfield data to brightfield forms, and a means of displaying said transformed information. Preferably, the imaging means is a block face microscope, and the means for transforming the images is a digital computer.


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